On Semi Choose Optimal Plus to monitor its Production
30 August, 2018
The deployment of Optimal Plus software solution will enable ON Semiconductor to lower Defective Parts Per Million (DPPM) rates to the single digit range
ON Semiconductor revealed that it is collaborating with Optimal Plus from Holon, Israel, to gather, analyze and build actionable insights out of the company’s manufacturing data. Following an initial pilot project that demonstrated in the company’s manufacturing operations, ON Semiconductor and Optimal Plus will further connect the ON Semiconductor global manufacturing footprint.
“Partnering with Optimal Plus is a key element to enable the shift from detect to predict and eventually prevent,” said Mark Goranson, ON Semiconductor VP for manufacturing. Mitch Mooney, GM of ON Semiconductor Nampa, Idaho operations, mentioned that Optimal Plus provides advanced analytics with real-time visibility of test operations. “We expect significant benefits in capital efficiency, yield enhancements and quality improvements.”
Data is essential for Operations Optimization
Optimal Plus solutions collects, clean and aggregates data from multiple manufacturing locations into coherent information. For semiconductor companies, it spans all manufacturing operations touchpoints where product data is generated, from MES and WAT to Wafer Sort, Final Test and System Level Test. The solution includes deep, multi-stage product analytics for near real-time response capabilities. A core element of the deployment will be enabling ON Semiconductor to lower their Defective Parts Per Million (DPPM) rates to the single digit range.
Dan Glotter, Optimal Plus Founder and CEO: “Together, ON Semiconductor and Optimal Plus are demonstrating how operations optimization is keeping manufacturers ahead of an increased adoption of Industrial IoT, electric vehicles, machine vision and other disruptive applications in automotive and industrial end markets.” Other costumers in the semiconductor’s industry include Qualcomm, Marvell, AMD and Nvidia.